Electron microscopes

JEOL JEM-1400Plus

The JEM-1400Plus features high resolution/high contrast imaging, outstanding TEM analytical performance, cryomicroscopy, 3D tomography, and montaging. This compact, easy-to-use TEM is suitable for biological, polymer, and materials science applications. JEOL JEM-1400Plus has an acceleration voltage up to 120kV. The machine accommodates measurements under cryogenic temperatures, using the available cryo-holder and sample preparation equipment for imaging thin biological and other aqueous samples.

FIB-SEM Zeiss Auriga (Crossbeam)

The Zeiss Auriga is a high resolution Focused Ion Beam Scanning Electron microscope. The Schottky field emitter allows a resolution downto 1 nm of the full 30 to 1 kilovolt range. The microscope has Inlens, Everhart-Thornley and backscatter detectors. Furthermore the microscope is equipped with a Gatan Alto 2500 cryo-stage, cryo-transfer and coating system. The EDS system is from Oxford Instruments for Energy Dispersive X-ray Spectroscopy. The Focused Ion Beam can directly modify or "mill" a sample surface with nanometer precision. The focused ion beam is used to etch the sample, thereby exposing a new surface which van be imaged by SEM. Repeating this process can reveal the full 3D representation of the internal structure.

FEI Magellan 400 FESEM

The Magellan 400 is a fully digital FESEM with Schottkey field emitter source providing subnanometer resolution over the full 1 kV to 30 kV electron energy range. The microscope has two detectors a Everhart-Thornley SE detector for SE detection, and NG in-lens detector (TLD) designed for high-resolution imaging even at low kV’s. The Magellan is equipped with a new generation energy dispersive spectroscopy (EDS) system from Oxford Instruments. Furthermore the Magellan is equipped with a cryostage and cryotransfer system.