JSPM-5400 Scanning Probe Microscope

The JSPM-5400 is a powerful scanning probe microscope. The microscope can be configured as either an atomic force microscope (AFM) or scanning tunneling microscope (STM). Standard AFM modes include contact, friction force microscopy, current image, non-contact AFM (constant excitation amplitude FM detection method)

Purpose: images of surfaces / studying surface structure

Characteristics: 

• ambient air, or vacuum (10-5 Pa)
• sample heated to 500° C (773K) or cooled to -143° C (130K)
• Airlock specimen exchange
• 25 mm scanner